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Elemental distribution in the small grain size fraction of particles of regolith samples 74220 and 75080 have been studied by X-ray photoelectronic spectroscopy. For both samples, a layered structure of the surface of particles was observed to be markedly different from those of the previously studied regolith samples collected by Luna automatic spacecraft. The particles of sample 74220 have a distinct two-layered structure, with a high content of S, Zn, Na, F and Cl in the outer layer, which apparently formed under conditions of high oxygen fugacity. An irregular distribution of reduced forms of element with depth, a high content of Ti and surface enrichments in Na are noted in sample 75080. Both features are characteristic of oxidation of the particle surfaces. They indicate that the surface layers of particles were formed by condensation processes: sample 75080 from an impact cloud and sample 74220 from a cloud of endogenic origin.
Chemical peculiarities of particle surface layers of some Apollo 17 regolith samples
Authors:
Dikov, Iu. P.; Bogatikov, O. A.; Barsukov, V. L.; Florenskii, K. P.; Ivanov, A. V.; Nemoshkalenko, V. V.; Aleshin, V. G.
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